Investigation of tapered multiple microstrip lines for VLSI circuits

Tapered, coupled, microstrip transmission lines are an increasingly important part of high-speed digital circuits. These lines, used as interconnects between integrated circuit devices, are modeled using an iteration-perturbation approach applied in the spatial domain. The approach is used first to solve the static problem, and then to iterate on the static solution to obtain the charge and current distributions on the lines at different frequencies. From this model, a frequency-dependent scattering parameter characterization is determined. Results for typical geometries are presented and are compared with those published by other authors.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Electrical Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2011

Author dc:creator

• Mehalic, Mark Andrew

Contributors dc:contributor

• Mittra, Raj

• Engineering, Electronics and Electrical
• Computer Science

Statement dc:rights

• Copyright 1989 Mehalic, Mark Andrew

Language dc:language

eng

Identifier

AAI9010956
(UMI)AAI9010956

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/21309