Quantitative electron microscopy of supported subnanometer clusters

Small supported particles (a few angstroms in diameter) are useful as catalysts because of their increased surface area for a given volume of material. Their catalytic activity and selectivity depends upon their size, which determines their electronic structure. Therefore, it is vital to reliably understand particle size distribution, and variation, which occurs due to fragmentation and sintering. In this research, I present a refined electron microscopy approach to study particle size distributions and use this to investigate the stability of very small cluster rhenium supported on graphite.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Materials Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2011

Author dc:creator

• Singhal, Ajay

Contributors dc:contributor

• Gibson, J. Murray

• Engineering, Chemical
• Engineering, Materials Science

Statement dc:rights

• Copyright 1996 Singhal, Ajay

Language dc:language

eng

Identifier

9780591199949
AAI9712437
(UMI)AAI9712437

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/21300