Abstract
dc:descriptionThe techniques of phonon imaging are used in conjunction with photoluminescence measurements to determine the characteristics of optically generated phonon sources in Si, Ge and GaAs at 1.7K. Focused-laser excitation of a semiconductor generates phonons as a byproduct of electronic excitation. A single carrier sheds this excess by the emission of optical phonons which cascade down in frequency, $\nu,$ by the normal anharmonic processes as they propagate in the crystal. This quasidiffusion of phonons is characterized by broad heat pulses at low excitation densities. At higher excitation densities carrier interactions may rapidly thermalize the excess carrier energy without optical phonon emission. The heated carrier distribution can directly emit low-$\nu$ acoustic phonons. The cross-over in energy relaxation mechanisms depends upon the continued production of high-$\nu$ phonons in the presence of a dense, cool plasma. The formation of such a plasma can be ascertained by observation of the electron-hole recombination luminescence.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Physics
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Msall, Madeleine Elizabeth
- Contributors dc:contributor
-
- Wolfe, J.P.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- Copyright 1995 Msall, Madeleine Elizabeth
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
-
AAI9522154
(UMI)AAI9522154 - OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/20710