University of Illinois at Urbana-Champaign
Partitioning algorithms for parallel circuit simulation
Abstract
dc:descriptionCircuit simulation is an indispensable tool in the design and analysis of Very Large Scale Integrated (VLSI) circuits. The most widely used circuit simulators rely on direct methods and offer the most accurate, reliable, and technology-independent means of simulating integrated circuits. The simulation process is inherently very computation intensive and, hence, can require a significant portion of the computational resources available for the development of VLSI circuits. With the use of multiprocessor computers becoming more widespread, there exists an opportunity to speed up the simulation by partitioning the circuit so that the computation may be spread among the processors. To accomplish this, the circuit is partitioned into subcircuits using a node tearing method. If the circuit matrix is ordered subcircuit by subcircuit followed by the tearing nodes, then the matrix takes a bordered-block-diagonal form and the LU-factorization of the diagonal blocks may take place in parallel. This thesis defines the important objectives for this partitioning task and presents two algorithms that may be used to meet the partitioning goals. The first algorithm is an iterative improvement algorithm and the second is a network flow algorithm. Partitioning results and speedups are given for a variety of circuits.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Engineering, Electronics and Electrical
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Yeh, David Ching-kai
- Contributors dc:contributor
-
- Rao, Vasant B.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- Copyright 1990 Yeh, David Ching-kai
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
-
AAI9026360
(UMI)AAI9026360 - OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/20676