Applications of electron energy loss spectroscopies to the study of surface chemistry

Two different kinds of electron energy loss spectroscopies have been used in this thesis to the study of surface chemistry. In the first part of the thesis which includes the first four chapters, Extended Electron Energy Loss Fine Structure (EXELFS) has been used to study the bonding of (1) oxygen atom in NiO film grown on Ni(100) and Ni(110) surface and (2) nitrogen atom overlayer on Cu(100) and Cu(110) surfaces. EXELFS spectra obtained from the K-level of oxygen in NiO film grown on both the Ni(100) and Ni(110) surfaces reveal that the NiO films grown on both surfaces have the same structure as bulk NiO. The Ni-O bond lengths are 2.08 A in both cases. EXELFS spectra obtained above the K-edge of nitrogen atoms adsorbed on the Cu(100) (c(2x2) overlayer) and Cu(110) (p(2x3) overlayer) indicate N-Cu bond lengths of 1.84 and 1.81 A for N on Cu(100) and Cu(110) surfaces, respectively. The difference is within the resolution of the experiment and does not indicate significant differences between the two adsorbate systems.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Chemistry

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2011

Author dc:creator

• Dai, Qing

Contributors dc:contributor

• Gellman, A.J.

• Chemistry, Physical
• Physics, Condensed Matter

Statement dc:rights

• Copyright 1992 Dai, Qing

Language dc:language

eng

Identifier

AAI9215800
(UMI)AAI9215800

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/19236