An implementation of sine wave test setup for automated measurement of high-performance analog-to-digital converters

The system described in this thesis was developed as part of a larger effort to design a high-performance ADC from the signal integrity standpoint. The direct motivation for designing a custom system was the need to evaluate the performance of the newly designed device, but also to create a vendor-independent solution that could be used to verify the validity of the PCB design techniques proposed to improve signal integrity of data converters. First, the IEEE 1241-2000 Standard for testing ADCs is introduced, and its key concepts and benefits are explained. Important metrics of ADC performance are identified and defined. The sine wave test setup for testing ADCs is presented next. The overall concept of this testing scheme is explained. Hardware chosen to implement the scheme is discussed. Several hardware issues and limitations are identified, along with the methods of characterizing and overcoming them. Next, the LabVIEW program written for measurement automation, instrument control, data acquisition, and postprocessing is discussed in detail. Both custom-written code and modification of vendor-provided code are documented. Each of the steps in program flow is illustrated in the form of a block diagram. Where appropriate, enhancements to existing algorithms and potential improvements are suggested. Finally, the proposed hardware and software setup is used to measure the dynamic parameters of two high-performance commercial ADCs, in order to test the validity and operation of the setup against manufacturer-specified performance metrics used as reference. Measurement results are presented and sources of discrepancies are discussed.

Name thesis:degree_name

M.S.

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Electrical and Computer Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2011

Author dc:creator

• Milosevic, Pavle

Contributors dc:contributor

• Schutt-Ainé, José E.

• analog-to-digital converters
• automated testing

Language dc:language

en

Handle dc:identifier

http://hdl.handle.net/2142/18752

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/18752