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University of Illinois at Urbana-Champaign

New mechanisms for defect engineering in titanium dioxide

Abstract

dc:description

The technologically useful properties of a solid often depend upon the types and concentrations of crystalline defects it contains. The concentrations of various defects can alter the electrical properties of a solid. Currently, defect engineering is applied extensively within the microelectronic industry but has not been utilized much in catalysis research. However, defects can be useful in altering the effectiveness of catalysts (including photocatalysts), the performance of photo-active devices, the sensitivity of solid-state electrolyte sensors, and the efficiency of devices for converting sunlight to electrical power. TiO2, in particular, is widely used as a catalyst and photocatalyst and is being explored for applications in sensor technology and coatings. This thesis involves identifying new mechanisms for defect engineering in titanium dioxide based on surface-bulk coupling, photo-stimulation, and interaction of charged defects at the surface. While titanium dioxide is utilized as a model, the principles observed for titanium dioxide will translate well into other metal oxide semiconductors. Through isotopic oxygen bulk diffusion studies done in an ultrahigh vacuum chamber, it has been observed that having a surface free from contamination increases the self-diffusion of oxygen in titanium dioxide. Photo-illumination effects were also observed for the defects in titanium dioxide. In addition an 18O pile-up in dopant concentration at the surface is evidence of an interaction between charged defects and the charged surface. Two models have been developed to help understand these mechanisms.

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Chemical Engineering
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2010

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Hollister, Alice G.
Contributors dc:contributor
  • Seebauer, Edmund G.
  • Abelson, John R.
  • Braatz, Richard D.
  • Masel, Richard I.

Subjects

dc:subject × 6

Rights

dc:rights
Statement dc:rights
  • Copyright 2010 Alice G. Hollister
Language dc:language
en

Identifiers

dc:identifier.*
Handle dc:identifier
http://hdl.handle.net/2142/15558
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/15558

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Hollister, Alice G.. New mechanisms for defect engineering in titanium dioxide. Dissertation thesis, University of Illinois at Urbana-Champaign, 2010. http://hdl.handle.net/2142/15558