Mismatched divergence and universal hypothesis testing

Item reinstated by Sarah Shreeves (sshreeve@illinois.edu) on 2012-01-07T11:00:14Z Item was in collections: Dissertations and Theses - Electrical and Computer Engineering (ID: 446) University of Illinois Dissertations and Theses (ID: 204) No. of bitstreams: 3 Huang_Dayu.pdf.txt: 77576 bytes, checksum: 24d221d5653b56f115a407da421bec70 (MD5) Huang_Dayu.pdf: 327190 bytes, checksum: 1e89146aa9ef1157d97e1b29645c8502 (MD5) license.txt: 4059 bytes, checksum: f3553b40cd35e763a5b88a902ed8d0a3 (MD5)

Name thesis:degree_name

M.S.

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Electrical & Computer Engr

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2010

Author dc:creator

• Huang, Dayu

Contributors dc:contributor

• Meyn, Sean P.

• Kullback-Leibler divergence
• Hoeffding test
• Pinsker's inequality
• universal hypothesis testing
• robust test
• mismatched universal test
• mismatched divergence
• detection
• learning
• variance
• variational representation

Statement dc:rights

• Copyright 2009 Dayu Huang

Language dc:language

en

Handle dc:identifier

http://hdl.handle.net/2142/14758

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/14758