Atomic force microscope cantilever with reduced second harmonic frequency during tip-surface contact

We describe an atomic force microscope cantilever design for which the second flexural mode frequency can be tailored relative to the first mode frequency, for operation in contact with a substrate. A freely-resonating paddle internal to the cantilever reduces the stiffness of the second flexural mode relative to the first while nearly maintaining the mass of the original cantilever. This strategy allows the ratio of the first two resonant modes f2/f1 to be controlled over the range 1.6 – 4.5. The ability to vary f2/f1 could improve a variety of dynamic contact-mode measurements.

Name thesis:degree_name

M.S.

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Mechanical Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2010

Author dc:creator

• Felts, Jonathan

Contributors dc:contributor

• King, William P.

• Atomic Force Microscope
• micro cantilever
• harmonic frequency
• mode shapes

Statement dc:rights

• Copyright 2009 Jonathan R. Felts

Language dc:language

en

Handle dc:identifier

http://hdl.handle.net/2142/14660

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/14660