Nanomechanical viscoelastic characterization of rubber with atomic force microscopy (AFM)

Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2022-11-14 without embargo terms

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Mechanical Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2022

Author dc:creator

• Poss, Matthew Michael

Contributors dc:contributor

• Tawfick, Sameh
• Jasiuk, Iwona
• Chasiotis, Ioannis
• Hutchens, Shelby

• Atomic Force Microscopy
• AFM
• Nanomechanics
• Natural Rubber
• Fast Force Mapping
• FFM
• Amplitude-Modulation Frequency-Modulation
• AM-FM
• Force Curve
• Force-Indentation Curve
• Force-Distance Curve
• Adhesive Viscoelastic Contact
• Adhesive Viscoelastic Nanomechanics
• Experimental Mechanics
• Experimental Nanomechanics
• Ting
• JKR
• DMT
• Quasi-static AFM
• Sub-resonant AFM
• PeakForce
• Force Map

Statement dc:rights

• Copyright 2022 Matthew Michael Poss

Language dc:language

en, eng

Handle dc:identifier

https://hdl.handle.net/2142/115818

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/115818