Analysis of signal-to-noise ratio of angle and degree of linear polarization in division of focal plane polarimeter

Recent advancement in nanofabrication technology has led to commercialization of single-chip polarization and color-polarization imaging sensors in the visible spectrum. Novel applications have arisen with the emergence of these sensors leading to questions about noise in the reconstructed polarization images. In this thesis, we provide theoretical analysis for the input and output referred noise for the angle and degree of linear polarization information. We validated our theoretical model with experimental data collected from a division of focal plane polarization sensors. Our data indicates that the noise in the angle of polarization images depends on both incident light intensity and degree of polarization and is independent of the incident angle of polarization. However, noise in degree of linear polarization images depends on all three parameters: incident light intensity, angle of polarization, and degree of polarization. This theoretical model can help guide the development of imaging setups to record optimal polarization information.

Name thesis:degree_name

M.S.

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Electrical & Computer Engr

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2021

Author dc:creator

• Chen, Yingkai

Contributors dc:contributor

• Gruev, Viktor

• Signal-to-noise ratio
• angle of polarization
• degree of polarization

Statement dc:rights

• Copyright 2021 Yingkai Chen

Language dc:language

en

Handle dc:identifier

http://hdl.handle.net/2142/110738

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/110738