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University of Illinois at Urbana-Champaign

Advances in electron imaging and diffraction of material defects and deformation mechanisms

Abstract

dc:description

Made available in DSpace on 2021-09-17T02:34:33Z (GMT). No. of bitstreams: 2 HSIAO-DISSERTATION-2021.pdf: 4928409 bytes, checksum: 9b5ac5f0800a349d703c04d725aeb491 (MD5) LICENSE.txt: 4210 bytes, checksum: 437e804068b0b7d4d1ada9465ca8ac7d (MD5) Previous issue date: 2021-04-21

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Materials Science & Engr
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2021

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Hsiao, Haw-Wen
Contributors dc:contributor
  • Zuo, Jian-Min
  • Bellon, Pascal
  • Huang, Pinshane Y.
  • Maass, Robert

Subjects

dc:subject × 5

Rights

dc:rights
Statement dc:rights
  • Copyright 2021 Haw-Wen Hsiao
Language dc:language
en

Identifiers

dc:identifier.*
Handle dc:identifier
http://hdl.handle.net/2142/110684
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/110684

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Hsiao, Haw-Wen. Advances in electron imaging and diffraction of material defects and deformation mechanisms. Dissertation thesis, University of Illinois at Urbana-Champaign, 2021. http://hdl.handle.net/2142/110684