University of Illinois at Urbana-Champaign
X-ray CT scatter correction by a physics-motivated deep neural network
Abstract
dc:descriptionA fundamental problem in X-ray Computed Tomography (CT) is the scatter occurring due to the interaction of photons with the imaged object. Unless it is corrected, this phenomenon manifests itself as degradations in the reconstructions in the form of various artifacts. This makes scatter correction a critical step to obtain the desired reconstruction quality. Scatter correction methods consist of two groups: hardware-based and software-based. Despite success in specific settings, hardware-based methods require modification in the hardware or an increase in the scan time or dose. This makes software-based methods attractive. In this context, Monte-Carlo based scatter estimation, analytical-numerical and kernel-based methods were developed. Furthermore, the capacity of data-driven approaches to tackle this problem was recently demonstrated. In this thesis, two novel physics-motivated deep-learning-based methods are proposed. The methods estimate and correct for the scatter in the obtained projection measurements. They incorporate both an initial reconstruction of the object of interest and the scatter-corrupted measurements related to it. They use a common specific deep neural network architecture and a cost function adapted to the problem. Numerical experiments with data obtained by Monte-Carlo simulations of the imaging of phantoms reveal noticeable improvement over a recent projection-domain deep neural network correction method.
Degree
thesis:*- Name thesis:degree_name
- M.S.
- Level thesis:degree_level
- Thesis
- Discipline thesis:degree_discipline
- Electrical & Computer Engr
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2021
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Iskender, Berk
- Contributors dc:contributor
-
- Bresler, Yoram
Subjects
dc:subject × 7Rights
dc:rights- Statement dc:rights
-
- Copyright 2020 Berk Iskender
- Language dc:language
- en
Identifiers
dc:identifier.*- Handle dc:identifier
- http://hdl.handle.net/2142/109445
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/109445