Back to results
Tilburg University
Machine learning for defect prediction in manufacturing : a regression-based approach using synthetic data in a manufacturing environment
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Hoek, T. van den
- Contributors dc:contributor
-
- Cule, B.
Rights
dc:rights- Statement dc:rights
-
- (c) Universiteit van Tilburg
- Language dc:language
- eng
Identifiers
dc:identifier.*- Repository record dc:identifier
- https://tilburguniversity.on.worldcat.org/search?queryString=scr.uvt.nl:11113444
- OAI identifier oai:identifier
- oai:scr.uvt.nl:11113444