Machine learning for defect prediction in manufacturing : a regression-based approach using synthetic data in a manufacturing environment
type: CreativeWork
author: Hoek, T. van den
language: eng
date published: 2024
date modified: 2026-07-24T05:03:44Z
provider: Tilburg University
publisher: Networked Digital Library of Theses and Dissertations
type: WebPage
source organization: Tilburg University