Scan test data compression using alternate Huffman coding

Huffman coding is a good method for statistically compressing test data with high compression rates. Unfortunately, the on-­‐chip decoder to decompress that encoded test data after it is loaded onto the chip may be too complex. With limited die area, the decoder complexity becomes a drawback. This makes Huffman coding not ideal for use in scan data compression. Selectively encoding test data using Huffman coding can provide similarly high compression rates while reducing the complexity of the decoder. A smaller and less complex decoder makes Alternate Huffman Coding a viable option for compressing and decompressing scan test data.

Name thesis:degree_name

Master of Science in Engineering

Level thesis:degree_level

Masters

Discipline thesis:degree_discipline

Electrical and Computer Engineering

Grantor

University of Texas at Austin

Year dc:date.issued

2012

Author dc:creator

• Baltaji, Najad Borhan

Advisor dc:contributor.advisor

• Touba, Nur A.

Committee member dc:contributor.committeemember

• Garg, Vijay K.

• Scan
• Test data
• Huffman coding

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/2152/ETD-UT-2012-05-5615

OAI identifier oai:identifier

oai:repositories.lib.utexas.edu:2152/ETD-UT-2012-05-5615