FINITE ELEMENT AND IMAGING APPROACHES TO ANALYZE MULTISCALE ELECTROTHERMAL PHENOMENA

Electrothermal effects are crucial in the design and optimization of electronic devices. Thermoreflectance (TR) imaging enables transient thermal characterization at submicron to centimeter scales. Typically, finite element methods (FEM) are used to calculate the temperature profile in devices and ICs with complex geometry. By comparing theory and experiment, important material parameters and device characteristics are extracted. In this work we combine TR and FEM with image blurring/reconstruction techniques to improve electrothermal characterization of micron and nanoscale devices.

Name thesis:degree_name

Doctor of Philosophy (PhD)

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Electrical and Computer Engineering

Year

2016

Author dc:creator

• Ziabari, Amir Koushyar

Contributors dc:contributor

• Ali Shakouri
• Charles Bouman
• Mark Lundstrom
• Ganesh Subbarayan

• Electro-thermal Effects
• Finite Element Modeling
• Image processing/reconstruction
• Thermoelectric Module
• Thermoreflectance Thermal Imaging

Repository record dc:identifier

https://docs.lib.purdue.edu/open_access_dissertations/1278

OAI identifier oai:identifier

oai:docs.lib.purdue.edu:open_access_dissertations-2494