{"id":{"repo_id":"purdue-thes","oai_identifier":"oai:docs.lib.purdue.edu:open_access_dissertations-2494"},"canonical_url":"https://search.dev.ndltd.org/etd/purdue-thes/oai:docs.lib.purdue.edu:open_access_dissertations-2494","repository":{"repo_id":"purdue-thes","name":"Purdue University","base_url":"https://docs.lib.purdue.edu/do/oai/"},"display":{"title":"FINITE ELEMENT AND IMAGING APPROACHES TO ANALYZE MULTISCALE ELECTROTHERMAL PHENOMENA","abstract":"Electrothermal effects are crucial in the design and optimization of electronic devices. Thermoreflectance (TR) imaging enables transient thermal characterization at submicron to centimeter scales. Typically, finite element methods (FEM) are used to calculate the temperature profile in devices and ICs with complex geometry. By comparing theory and experiment, important material parameters and device characteristics are extracted. In this work we combine TR and FEM with image blurring/reconstruction techniques to improve electrothermal characterization of micron and nanoscale devices.","abstract_html":"Electrothermal effects are crucial in the design and optimization of electronic devices. Thermoreflectance (TR) imaging enables transient thermal characterization at submicron to centimeter scales. Typically, finite element methods (FEM) are used to calculate the temperature profile in devices and ICs with complex geometry. By comparing theory and experiment, important material parameters and device characteristics are extracted. In this work we combine TR and FEM with image blurring/reconstruction techniques to improve electrothermal characterization of micron and nanoscale devices.","abstract_has_math":false,"creators":["Ziabari, Amir Koushyar"],"institution":null,"degree_name":"Doctor of Philosophy (PhD)","degree_level":"Dissertation","degree_discipline":"Electrical and Computer Engineering","degree_department":null,"school":null,"contributors":["Ali Shakouri","Charles Bouman","Mark Lundstrom","Ganesh Subbarayan"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2016,"date_issued":"2016-01-01T08:00:00Z","date_published":"2016-01-01T08:00:00Z","updated_at":"2026-07-24T03:54:31Z","subjects":["Electro-thermal Effects","Finite Element Modeling","Image processing/reconstruction","Thermoelectric Module","Thermoreflectance Thermal Imaging"],"languages":[],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://docs.lib.purdue.edu/open_access_dissertations/1278","outbound_label":"Repository record","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Ali Shakouri","Charles Bouman","Mark Lundstrom","Ganesh Subbarayan"]},{"key":"dc:creator","label":"Author","values":["Ziabari, Amir Koushyar"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical and Computer Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Doctor of Philosophy (PhD)"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Electro-thermal Effects","Finite Element Modeling","Image processing/reconstruction","Thermoelectric Module","Thermoreflectance Thermal Imaging"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://docs.lib.purdue.edu/open_access_dissertations/1278"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["Electrothermal effects are crucial in the design and optimization of electronic devices. Thermoreflectance (TR) imaging enables transient thermal characterization at submicron to centimeter scales. Typically, finite element methods (FEM) are used to calculate the temperature profile in devices and ICs with complex geometry. By comparing theory and experiment, important material parameters and device characteristics are extracted. In this work we combine TR and FEM with image blurring/reconstruction techniques to improve electrothermal characterization of micron and nanoscale devices."]},{"key":"dc:title","label":"Title","values":["FINITE ELEMENT AND IMAGING APPROACHES TO ANALYZE MULTISCALE ELECTROTHERMAL PHENOMENA"]}]}],"canonical_facts":{"dc:contributor":["Ali Shakouri","Charles Bouman","Mark Lundstrom","Ganesh Subbarayan"],"dc:creator":["Ziabari, Amir Koushyar"],"dc:description.abstract":["Electrothermal effects are crucial in the design and optimization of electronic devices. Thermoreflectance (TR) imaging enables transient thermal characterization at submicron to centimeter scales. Typically, finite element methods (FEM) are used to calculate the temperature profile in devices and ICs with complex geometry. By comparing theory and experiment, important material parameters and device characteristics are extracted. In this work we combine TR and FEM with image blurring/reconstruction techniques to improve electrothermal characterization of micron and nanoscale devices."],"dc:identifier":["https://docs.lib.purdue.edu/open_access_dissertations/1278"],"dc:subject":["Electro-thermal Effects","Finite Element Modeling","Image processing/reconstruction","Thermoelectric Module","Thermoreflectance Thermal Imaging"],"dc:title":["FINITE ELEMENT AND IMAGING APPROACHES TO ANALYZE MULTISCALE ELECTROTHERMAL PHENOMENA"],"thesis:degree_discipline":["Electrical and Computer Engineering"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Doctor of Philosophy (PhD)"]},"updated_at":"2026-07-24T03:54:31Z"}