Abstract
dc:description.abstractMicrowave impedance microscopy (MIM) is a scanning probe technique that measures local changes in tip-sample admittance. The imaginary part of the reported change is calibrated with finite element simulations and physical measurements of a standard capacitive sample, and thereafter the output ∆Y is given a reference value in siemens. Simulations also provide a means of extracting sample conductivity and permittivity from admittance, a procedure verified by comparing the estimated permittivity of polytetrafluoroethlyene (PTFE) to the accepted value. Finally, the well-known effective medium approximation of Bruggeman is considered as a means of estimating the volume fractions of the constituents in inhomogeneous two-phase systems. Specifically, we consider the estimation of porosity in nanostructured carbons often used in charge storage devices, such as carbide derived carbon (CDC) and onion-like carbon (OLC).
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Jones, Timothy Scott
- Advisor dc:contributor.advisor
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- Jorge J. Santiago-Avilès
Rights
dc:rights- Statement dc:rights
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- Timothy Scott Jones
- Language dc:language
- en
Identifiers
dc:identifier.*- Repository record dc:identifier.uri
- https://repository.upenn.edu/handle/20.500.14332/29284
- OAI identifier oai:identifier
- oai:repository.upenn.edu:20.500.14332/29284