{"id":{"repo_id":"penn","oai_identifier":"oai:repository.upenn.edu:20.500.14332/29284"},"canonical_url":"https://search.dev.ndltd.org/etd/penn/oai:repository.upenn.edu:20.500.14332/29284","repository":{"repo_id":"penn","name":"University of Pennsylvania","base_url":"https://repository.upenn.edu/server/oai/request"},"display":{"title":"Microwave Impedance Microscopy Of Nanostructured Carbon","abstract":"Microwave impedance microscopy (MIM) is a scanning probe technique that measures local changes in tip-sample admittance. The imaginary part of the reported change is calibrated with finite element simulations and physical measurements of a standard capacitive sample, and thereafter the output ∆Y is given a reference value in siemens. Simulations also provide a means of extracting sample conductivity and permittivity from admittance, a procedure verified by comparing the estimated permittivity of polytetrafluoroethlyene (PTFE) to the accepted value. Finally, the well-known effective medium approximation of Bruggeman is considered as a means of estimating the volume fractions of the constituents in inhomogeneous two-phase systems. Specifically, we consider the estimation of porosity in nanostructured carbons often used in charge storage devices, such as carbide derived carbon (CDC) and onion-like carbon (OLC).","abstract_html":"Microwave impedance microscopy (MIM) is a scanning probe technique that measures local changes in tip-sample admittance. The imaginary part of the reported change is calibrated with finite element simulations and physical measurements of a standard capacitive sample, and thereafter the output ∆Y is given a reference value in siemens. Simulations also provide a means of extracting sample conductivity and permittivity from admittance, a procedure verified by comparing the estimated permittivity of polytetrafluoroethlyene (PTFE) to the accepted value. Finally, the well-known effective medium approximation of Bruggeman is considered as a means of estimating the volume fractions of the constituents in inhomogeneous two-phase systems. Specifically, we consider the estimation of porosity in nanostructured carbons often used in charge storage devices, such as carbide derived carbon (CDC) and onion-like carbon (OLC).","abstract_has_math":false,"creators":["Jones, Timothy Scott"],"institution":null,"degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":[],"advisors":["Jorge J. Santiago-Avilès"],"committee_chairs":[],"committee_members":[],"year":2016,"date_issued":"2016-01-01","date_published":"2016-01-01","updated_at":"2026-07-24T03:45:26Z","subjects":[],"languages":["en"],"rights":["Timothy Scott Jones"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://repository.upenn.edu/handle/20.500.14332/29284","outbound_label":"Repository record","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Jorge J. 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The imaginary part of the reported change is calibrated with finite element simulations and physical measurements of a standard capacitive sample, and thereafter the output ∆Y is given a reference value in siemens. Simulations also provide a means of extracting sample conductivity and permittivity from admittance, a procedure verified by comparing the estimated permittivity of polytetrafluoroethlyene (PTFE) to the accepted value. Finally, the well-known effective medium approximation of Bruggeman is considered as a means of estimating the volume fractions of the constituents in inhomogeneous two-phase systems. Specifically, we consider the estimation of porosity in nanostructured carbons often used in charge storage devices, such as carbide derived carbon (CDC) and onion-like carbon (OLC)."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["Doctor of Philosophy (PhD)"]},{"key":"dc:format.mimetype","label":"Dc Format Mimetype","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Microwave Impedance Microscopy Of Nanostructured Carbon"]}]}],"canonical_facts":{"dc:contributor.advisor":["Jorge J. Santiago-Avilès"],"dc:creator":["Jones, Timothy Scott"],"dc:date":["2023-05-17T19:31:16.000"],"dc:date.accessioned":["2023-05-22T17:05:06Z"],"dc:date.available":["2001-01-01T00:00:00Z"],"dc:date.issued":["2016-01-01"],"dc:description.abstract":["Microwave impedance microscopy (MIM) is a scanning probe technique that measures local changes in tip-sample admittance. The imaginary part of the reported change is calibrated with finite element simulations and physical measurements of a standard capacitive sample, and thereafter the output ∆Y is given a reference value in siemens. Simulations also provide a means of extracting sample conductivity and permittivity from admittance, a procedure verified by comparing the estimated permittivity of polytetrafluoroethlyene (PTFE) to the accepted value. Finally, the well-known effective medium approximation of Bruggeman is considered as a means of estimating the volume fractions of the constituents in inhomogeneous two-phase systems. Specifically, we consider the estimation of porosity in nanostructured carbons often used in charge storage devices, such as carbide derived carbon (CDC) and onion-like carbon (OLC)."],"dc:description.degree":["Doctor of Philosophy (PhD)"],"dc:format.mimetype":["application/pdf"],"dc:identifier.uri":["https://repository.upenn.edu/handle/20.500.14332/29284"],"dc:language":["en"],"dc:rights":["Timothy Scott Jones"],"dc:title":["Microwave Impedance Microscopy Of Nanostructured Carbon"],"dc:type":["Dissertation/Thesis"]},"updated_at":"2026-07-24T03:45:26Z"}