HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS

LOU CHOON LEONG

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National University of Singapore

HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS

dc:creator LOU CHOON LEONG

dc:date.issued1997

Abstract

Ph.D

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: LOU CHOON LEONG
Advisors dc:contributor.supervisor: CHAN DANIEL SIU HUNG
CHIM WAI KIN

Identifiers

dc:identifier.*

Repository record dc:identifier.uri: https://scholarbank.nus.edu.sg/handle/10635/177859
OAI record oai:identifier: https://scholarbank.nus.edu.sg/oai/request?verb=GetRecord&metadataPrefix=dim&identifier=oai%3Ascholarbank.nus.edu.sg%3A10635%2F177859

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Harvested from: National University of Singapore
Base URL: scholarbank.nus.edu.sg/oai/request
Last updated: 2026-08-21
Source record: OAI-PMH GetRecord

related terms

nus
1997

citation

LOU CHOON LEONG. HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS. 1997. https://scholarbank.nus.edu.sg/handle/10635/177859

HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS

Abstract

Author and committee

Identifiers

Chain of custody

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