Emission source microscopy for electromagnetic interference source localization

<p>"For complex and large systems with multiple sources, it is often difficult to localize the sources of radiation. Near-field electromagnetic scanning is used often for root-cause diagnosis by determining field distribution close to the PCB. In the near-field, the evanescent waves are dominant, which may lead to the misinterpretation of them being the dominant sources contributing to the far-field. Another limitation of near-field scanning is that the probe may not be able to access all locations near the PCB due to the complex geometry and high component density. Two-dimensional synthetic aperture radar is a well-known technique used for antenna diagnostic and alignment of phase array antennas. Using a technique which is derived from the synthetic aperture radar we present emission source microscopy to localize the sources of active radiation on a PCB. After obtaining the location of sources, using near field to far-field transformation, it is shown that the far-field radiation patterns and the total radiated power can be estimated. Using masking algorithms the contribution of individual sources to far-field can be determined. The source localization methodology is presented along with simulation and measurement results on real-DUTs. The results show that the proposed method is capable of detecting multiple active sources on a complex PCB. Different phase measurement methods are presented along with the measurement results. Also, methods to reduce the scanning time for source localization are presented"--Abstract, page iii.</p>

Name thesis:degree_name

Ph. D. in Computer Engineering

Grantor

Missouri University of Science and Technology

Year dc:date.available

2016

Author dc:creator

• Maheshwari, Pratik Rajesh

• EMI
• Near field scanning
• Near to far field
• Source localization
• Electrical and Computer Engineering

Repository record dc:identifier

https://scholarsmine.mst.edu/doctoral_dissertations/2334

OAI identifier oai:identifier

oai:scholarsmine.mst.edu:doctoral_dissertations-3336