\"For complex and large systems with multiple sources, it is often difficult to localize the sources of radiation. Near-field electromagnetic scanning is used often for root-cause diagnosis by determining field distribution close to the PCB. In the near-field, the evanescent waves are dominant, which may lead to the misinterpretation of them being the dominant sources contributing to the far-field. Another limitation of near-field scanning is that the probe may not be able to access all locations near the PCB due to the complex geometry and high component density. Two-dimensional synthetic aperture radar is a well-known technique used for antenna diagnostic and alignment of phase array antennas. Using a technique which is derived from the synthetic aperture radar we present emission source microscopy to localize the sources of active radiation on a PCB. After obtaining the location of sources, using near field to far-field transformation, it is shown that the far-field radiation patterns and the total radiated power can be estimated. Using masking algorithms the contribution of individual sources to far-field can be determined. The source localization methodology is presented along with simulation and measurement results on real-DUTs. The results show that the proposed method is capable of detecting multiple active sources on a complex PCB. Different phase measurement methods are presented along with the measurement results. Also, methods to reduce the scanning time for source localization are presented\"--Abstract, page iii.
","abstract_html":"<p>"For complex and large systems with multiple sources, it is often difficult to localize the sources of radiation. Near-field electromagnetic scanning is used often for root-cause diagnosis by determining field distribution close to the PCB. In the near-field, the evanescent waves are dominant, which may lead to the misinterpretation of them being the dominant sources contributing to the far-field. Another limitation of near-field scanning is that the probe may not be able to access all locations near the PCB due to the complex geometry and high component density. Two-dimensional synthetic aperture radar is a well-known technique used for antenna diagnostic and alignment of phase array antennas. Using a technique which is derived from the synthetic aperture radar we present emission source microscopy to localize the sources of active radiation on a PCB. After obtaining the location of sources, using near field to far-field transformation, it is shown that the far-field radiation patterns and the total radiated power can be estimated. Using masking algorithms the contribution of individual sources to far-field can be determined. The source localization methodology is presented along with simulation and measurement results on real-DUTs. The results show that the proposed method is capable of detecting multiple active sources on a complex PCB. Different phase measurement methods are presented along with the measurement results. Also, methods to reduce the scanning time for source localization are presented"--Abstract, page iii.</p>","abstract_has_math":false,"creators":["Maheshwari, Pratik Rajesh"],"institution":"Missouri University of Science and Technology","degree_name":"Ph. D. in Computer Engineering","degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2016,"date_issued":"2016-02-10T08:00:00Z","date_published":"2016-02-10T08:00:00Z","updated_at":"2026-07-24T03:19:21Z","subjects":["EMI","Near field scanning","Near to far field","Source localization","Electrical and Computer Engineering"],"languages":[],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://scholarsmine.mst.edu/doctoral_dissertations/2334","outbound_label":"Repository record","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:creator","label":"Author","values":["Maheshwari, Pratik Rajesh"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.available","label":"Dc Date Available","values":["2016-02-10T08:00:00Z"]},{"key":"dc:type","label":"Dc Type","values":["Dissertation - Open Access"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph. D. in Computer Engineering"]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Missouri University of Science and Technology"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["EMI","Near field scanning","Near to far field","Source localization","Electrical and Computer Engineering"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://scholarsmine.mst.edu/doctoral_dissertations/2334"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["\"For complex and large systems with multiple sources, it is often difficult to localize the sources of radiation. Near-field electromagnetic scanning is used often for root-cause diagnosis by determining field distribution close to the PCB. In the near-field, the evanescent waves are dominant, which may lead to the misinterpretation of them being the dominant sources contributing to the far-field. Another limitation of near-field scanning is that the probe may not be able to access all locations near the PCB due to the complex geometry and high component density. Two-dimensional synthetic aperture radar is a well-known technique used for antenna diagnostic and alignment of phase array antennas. Using a technique which is derived from the synthetic aperture radar we present emission source microscopy to localize the sources of active radiation on a PCB. After obtaining the location of sources, using near field to far-field transformation, it is shown that the far-field radiation patterns and the total radiated power can be estimated. Using masking algorithms the contribution of individual sources to far-field can be determined. The source localization methodology is presented along with simulation and measurement results on real-DUTs. The results show that the proposed method is capable of detecting multiple active sources on a complex PCB. Different phase measurement methods are presented along with the measurement results. Also, methods to reduce the scanning time for source localization are presented\"--Abstract, page iii.
"]},{"key":"dc:title","label":"Title","values":["Emission source microscopy for electromagnetic interference source localization"]}]}],"canonical_facts":{"dc:creator":["Maheshwari, Pratik Rajesh"],"dc:date.available":["2016-02-10T08:00:00Z"],"dc:description.abstract":["\"For complex and large systems with multiple sources, it is often difficult to localize the sources of radiation. Near-field electromagnetic scanning is used often for root-cause diagnosis by determining field distribution close to the PCB. In the near-field, the evanescent waves are dominant, which may lead to the misinterpretation of them being the dominant sources contributing to the far-field. Another limitation of near-field scanning is that the probe may not be able to access all locations near the PCB due to the complex geometry and high component density. Two-dimensional synthetic aperture radar is a well-known technique used for antenna diagnostic and alignment of phase array antennas. Using a technique which is derived from the synthetic aperture radar we present emission source microscopy to localize the sources of active radiation on a PCB. After obtaining the location of sources, using near field to far-field transformation, it is shown that the far-field radiation patterns and the total radiated power can be estimated. Using masking algorithms the contribution of individual sources to far-field can be determined. The source localization methodology is presented along with simulation and measurement results on real-DUTs. The results show that the proposed method is capable of detecting multiple active sources on a complex PCB. Different phase measurement methods are presented along with the measurement results. Also, methods to reduce the scanning time for source localization are presented\"--Abstract, page iii.
"],"dc:identifier":["https://scholarsmine.mst.edu/doctoral_dissertations/2334"],"dc:subject":["EMI","Near field scanning","Near to far field","Source localization","Electrical and Computer Engineering"],"dc:title":["Emission source microscopy for electromagnetic interference source localization"],"dc:type":["Dissertation - Open Access"],"thesis:degree_name":["Ph. D. in Computer Engineering"],"thesis:institution_name":["Missouri University of Science and Technology"]},"updated_at":"2026-07-24T03:19:21Z"}