Driving cycle time reduction through an improved material flow process in the electronics assembly manufacturing cell

Many companies have implemented lean and six sigma programs over the past twenty years. Lean has been a proven system that has eliminated waste and created value at many companies throughout the world. Raytheon IDS's lean program, "Raytheon Six Sigma" became a top priority in the past ten years at the Integrated Air Defense Center (IADC) in Andover, MA. However, as Raytheon's corporate goals state, they want to take this further and bring "Raytheon Six Sigma" to the next level, fully engaging customers and partners. A focus of this continuous improvement effort was the Electronics Assembly Rack manufacturing cell, which was experiencing high levels of cycle time variability. To help reduce cycle times within the cell, a continuous improvement project was undertaken to improve the material flow process. A current state analysis of the process showed an opportunity to improve process standardization and prioritization while lowering inventory levels. In addition to working with managers from EA to evaluate the material flow process, a kitting cart was developed with a cross functional project team to serve as a tool to help improve the process. Although the improvements were not rolled out to the entire cell during the project, a successful pilot was conducted that helped improve engagement with operators and create a path for future success.

Department dc:contributor.department

Leaders for Global Operations Program at MIT

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2012

Author dc:creator

• Millerd, Paul, M.B.A. Massachusetts Institute of Technology.

Advisor dc:contributor.advisor

• Roy Welsch and Daniel Whitney.

• Sloan School of Management.
• Engineering Systems Division.
• Leaders for Global Operations Program.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/73395

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/73395