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Massachusetts Institute of Technology

Numerical simulation of a single wafer atomic layer deposition process

Abstract

dc:description.abstract

Atomic Layer Deposition (ALD) is a process used to deposit nanometer scale films for use in nano electronics. A typical experimental reactor consist of a warm wall horizontal flow tube, a single disc mounted halfway down the tube, and an alternating cycle flow between a reactant gas and a wash in a carrier gas. The process is governed by the desire to achieve a uniform coating on the substrate layer. Optimization is currently accomplished by monitoring the precursor delivery and the growth of the film and adjusting flow rates accordingly. Maslar et al (2008) showed that it is possible to use in situ monitoring of the gas phase for optimization. With the data provided from that work, it is now possible to verify a numerical model of the flow process. The process can be thought of in 5 parts: unsteady undeveloped pipe flow, mixing, flow around a disc, flow impinging on a disc, boundary layer reactions on a wall. In this thesis, I numerically simulated the unsteady undeveloped pipe flow, mixing and boundary layer reactions on the wall. I also describe but do not solve a model for the complete process and propose criteria for optimization.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Dept. of Mechanical Engineering.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2010

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Jones, A. Andrew D., III (Akhenaton-Andrew Dhafir)
Advisor dc:contributor.advisor
  • Kripa Varanasi.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/59855
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/59855

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Jones, A. Andrew D., III (Akhenaton-Andrew Dhafir). Numerical simulation of a single wafer atomic layer deposition process. Massachusetts Institute of Technology, 2010. http://hdl.handle.net/1721.1/59855