Non-destructive electron microscopy through interaction-free quantum measurement

In this thesis, the possibility of interaction-free quantum measurements with electrons is investigated. With a scheme based on existing charged particle trapping techniques, it is demonstrated that such interaction-free measurements are possible in the presence of previously measured quantum decoherence rates, and the efficiency of the measurement scheme and the absorption probability are estimated. Use of such interaction-free measurements with electrons in imaging applications could dramatically reduce sample damage induced by electron-exposure, which might allow non-destructive, molecular-resolution electron microscopy.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2008

Author dc:creator

• Putnam, William P

Advisor dc:contributor.advisor

• Mehmet Fatih Yanik.

• Electrical Engineering and Computer Science.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/53178

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/53178