{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/53178"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/53178","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"Non-destructive electron microscopy through interaction-free quantum measurement","abstract":"In this thesis, the possibility of interaction-free quantum measurements with electrons is investigated. With a scheme based on existing charged particle trapping techniques, it is demonstrated that such interaction-free measurements are possible in the presence of previously measured quantum decoherence rates, and the efficiency of the measurement scheme and the absorption probability are estimated. 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