Massachusetts Institute of Technology
Anisotropic wave guides-- propagation, focusing and dispersive phenomena with applications for non-destructive testing.
Abstract
dc:description.abstractAcoustic Non-Destructive Testing (NDT) has a long history of applications in fatigue monitoring, fault testing, and more recently production control. A very large family of manufactured and raw materials consist of thin layers. Some examples include rolled aluminum, window glass, plywood, automobile bodies, plane wings, silicon wafers, bridge support beams, and paper. These layers can be viewed and modeled as acoustic waveguides. This thesis will present the framework in which to analyze such layers. To this end, analytic solutions to the plane wave displacement and stress fields in a single layer monoclinic material will be presented The propagation, frequency, and dispersive characteristics of transmitted signals can be analyzed to determine various elastic properties of the layer or to identify faults. Wavelet (time-frequency), Fourier (frequency), and signal matching (time) techniques will be developed to analyze and extract features and properties of signals. Several experimental examples will be presented.
Degree
thesis:*- Department dc:contributor.department
- Massachusetts Institute of Technology. Department of Mechanical Engineering
- Grantor dc:publisher
- Massachusetts Institute of Technology
- Year dc:date.issued
- 1998
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Anthony, Brian W., 1972-
- Advisor dc:contributor.advisor
-
- J. Kenneth Salisbury, Jr.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
- Licence dc:rights.uri
- Language dc:language.iso
- eng
Identifiers
dc:identifier.*- Handle dc:identifier.uri
- http://hdl.handle.net/1721.1/50067
- OAI identifier oai:identifier
- oai:dspace.mit.edu:1721.1/50067