Massachusetts Institute of Technology
Radio frequency identification (RFID) applications in semiconductor manufacturing
Abstract
dc:description.abstractRadio frequency identification (RFID) has an enormous potential impact within the semiconductor supply chain, especially within semiconductor manufacturing. The end benefit of RFID will be in the mass serialization, and the subsequent tracking and tracing, of individual semiconductors, or what is referred to as Unit Level Traceability (ULT). Before all of the technical hurdles of ULT are overcome, however, there exists a host of other applications for RFID within semiconductor manufacturing. The identification of what can and what should be RFID-tagged and read, the analysis of how to collect this information and what to do with the data, and the implementation of some targeted opportunities will provides valuable information with regards to the technical and logistical hurdles of RFID within semiconductor manufacturing far before ULT becomes a reality.
Degree
thesis:*- Department dc:contributor.department
- Massachusetts Institute of Technology. Engineering Systems Division.
- Grantor dc:publisher
- Massachusetts Institute of Technology
- Year dc:date.issued
- 2004
Author and committee
dc:creator, dc:contributor.*- Authors dc:creator
-
- Cassett, David Ian, 1971-
- Hopeman, Christopher William Chiu, 1976-
- Advisor dc:contributor.advisor
-
- James B. Rice, Jr.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
- Licence dc:rights.uri
- Language dc:language.iso
- en_US
Identifiers
dc:identifier.*- Handle dc:identifier.uri
- http://hdl.handle.net/1721.1/28503
- OAI identifier oai:identifier
- oai:dspace.mit.edu:1721.1/28503