{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/28503"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/28503","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"Radio frequency identification (RFID) applications in semiconductor manufacturing","abstract":"Radio frequency identification (RFID) has an enormous potential impact within the semiconductor supply chain, especially within semiconductor manufacturing. The end benefit of RFID will be in the mass serialization, and the subsequent tracking and tracing, of individual semiconductors, or what is referred to as Unit Level Traceability (ULT). Before all of the technical hurdles of ULT are overcome, however, there exists a host of other applications for RFID within semiconductor manufacturing. The identification of what can and what should be RFID-tagged and read, the analysis of how to collect this information and what to do with the data, and the implementation of some targeted opportunities will provides valuable information with regards to the technical and logistical hurdles of RFID within semiconductor manufacturing far before ULT becomes a reality.","abstract_html":"Radio frequency identification (RFID) has an enormous potential impact within the semiconductor supply chain, especially within semiconductor manufacturing. The end benefit of RFID will be in the mass serialization, and the subsequent tracking and tracing, of individual semiconductors, or what is referred to as Unit Level Traceability (ULT). Before all of the technical hurdles of ULT are overcome, however, there exists a host of other applications for RFID within semiconductor manufacturing. The identification of what can and what should be RFID-tagged and read, the analysis of how to collect this information and what to do with the data, and the implementation of some targeted opportunities will provides valuable information with regards to the technical and logistical hurdles of RFID within semiconductor manufacturing far before ULT becomes a reality.","abstract_has_math":false,"creators":["Cassett, David Ian, 1971-","Hopeman, Christopher William Chiu, 1976-"],"institution":"Massachusetts Institute of Technology","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":"Massachusetts Institute of Technology. Engineering Systems Division.","school":null,"contributors":[],"advisors":["James B. Rice, Jr."],"committee_chairs":[],"committee_members":[],"year":2004,"date_issued":"2004","date_published":"2004","updated_at":"2026-07-22T22:21:59Z","subjects":["Engineering Systems Division."],"languages":["en_US"],"rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"rights_urls":["http://dspace.mit.edu/handle/1721.1/7582"],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/1721.1/28503","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["James B. Rice, Jr."]},{"key":"dc:contributor.department","label":"Department","values":["Massachusetts Institute of Technology. Engineering Systems Division."]},{"key":"dc:contributor.other","label":"Dc Contributor Other","values":["Massachusetts Institute of Technology. Engineering Systems Division."]},{"key":"dc:creator","label":"Author","values":["Cassett, David Ian, 1971-","Hopeman, Christopher William Chiu, 1976-"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2005-09-26T20:48:31Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2005-09-26T20:48:31Z"]},{"key":"dc:date.issued","label":"Date","values":["2004"]},{"key":"dc:publisher","label":"Institution","values":["Massachusetts Institute of Technology"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering Systems Division."]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["en_US"]},{"key":"dc:rights","label":"Dc Rights","values":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://dspace.mit.edu/handle/1721.1/7582"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/1721.1/28503"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Thesis (M. Eng. in Logistics)--Massachusetts Institute of Technology, Engineering Systems Division, 2004.","Includes bibliographical references (p. 87)."]},{"key":"dc:description.abstract","label":"Abstract","values":["Radio frequency identification (RFID) has an enormous potential impact within the semiconductor supply chain, especially within semiconductor manufacturing. The end benefit of RFID will be in the mass serialization, and the subsequent tracking and tracing, of individual semiconductors, or what is referred to as Unit Level Traceability (ULT). Before all of the technical hurdles of ULT are overcome, however, there exists a host of other applications for RFID within semiconductor manufacturing. The identification of what can and what should be RFID-tagged and read, the analysis of how to collect this information and what to do with the data, and the implementation of some targeted opportunities will provides valuable information with regards to the technical and logistical hurdles of RFID within semiconductor manufacturing far before ULT becomes a reality."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["M.Eng.in Logistics"]},{"key":"dc:format.mimetype","label":"Dc Format Mimetype","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Radio frequency identification (RFID) applications in semiconductor manufacturing"]}]}],"canonical_facts":{"dc:contributor.advisor":["James B. Rice, Jr."],"dc:contributor.department":["Massachusetts Institute of Technology. Engineering Systems Division."],"dc:contributor.other":["Massachusetts Institute of Technology. Engineering Systems Division."],"dc:creator":["Cassett, David Ian, 1971-","Hopeman, Christopher William Chiu, 1976-"],"dc:date.accessioned":["2005-09-26T20:48:31Z"],"dc:date.available":["2005-09-26T20:48:31Z"],"dc:date.issued":["2004"],"dc:description":["Thesis (M. Eng. in Logistics)--Massachusetts Institute of Technology, Engineering Systems Division, 2004.","Includes bibliographical references (p. 87)."],"dc:description.abstract":["Radio frequency identification (RFID) has an enormous potential impact within the semiconductor supply chain, especially within semiconductor manufacturing. The end benefit of RFID will be in the mass serialization, and the subsequent tracking and tracing, of individual semiconductors, or what is referred to as Unit Level Traceability (ULT). Before all of the technical hurdles of ULT are overcome, however, there exists a host of other applications for RFID within semiconductor manufacturing. The identification of what can and what should be RFID-tagged and read, the analysis of how to collect this information and what to do with the data, and the implementation of some targeted opportunities will provides valuable information with regards to the technical and logistical hurdles of RFID within semiconductor manufacturing far before ULT becomes a reality."],"dc:description.degree":["M.Eng.in Logistics"],"dc:format.mimetype":["application/pdf"],"dc:identifier.uri":["http://hdl.handle.net/1721.1/28503"],"dc:language.iso":["en_US"],"dc:publisher":["Massachusetts Institute of Technology"],"dc:rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"dc:rights.uri":["http://dspace.mit.edu/handle/1721.1/7582"],"dc:subject":["Engineering Systems Division."],"dc:title":["Radio frequency identification (RFID) applications in semiconductor manufacturing"],"dc:type":["Thesis"]},"updated_at":"2026-07-22T22:21:59Z"}