Design and control optimization for high-speed jumping mode Atomic Force Microscope

In this thesis, I improved the design of a high-speed Atomic Force Microscope (AFM) for jumping mode operation. The relations between important imaging parameters and physical limitations of the system were established first to identify the aspects of improvement. Two control algorithms to improve the imaging speed and probe sample interaction force for jumping mode atomic force microscopy operation have been proposed and investigated both in simulation and experiment. A new generation of multi-actuated sample scanner has been designed to address the dynamic coupling, thermal expansion and range issues in the previous design. Improvements to the optical beam deflection system, photodiode circuit, signal conditioning circuit and cantilever probe holder with actuators have been implemented. The combined optimization and design work improved the capability of the original custom made high-speed AFM setup in both subsystem performance and jumping mode operation.

Department dc:contributor.department

Massachusetts Institute of Technology. Department of Mechanical Engineering.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2017

Author dc:creator

• Xia, Fangzhou

Advisor dc:contributor.advisor

• Kamal Youcef-Toumi.

• Mechanical Engineering.

Statement dc:rights

• MIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/111897

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/111897