{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/111897"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/111897","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"Design and control optimization for high-speed jumping mode Atomic Force Microscope","abstract":"In this thesis, I improved the design of a high-speed Atomic Force Microscope (AFM) for jumping mode operation. The relations between important imaging parameters and physical limitations of the system were established first to identify the aspects of improvement. Two control algorithms to improve the imaging speed and probe sample interaction force for jumping mode atomic force microscopy operation have been proposed and investigated both in simulation and experiment. A new generation of multi-actuated sample scanner has been designed to address the dynamic coupling, thermal expansion and range issues in the previous design. Improvements to the optical beam deflection system, photodiode circuit, signal conditioning circuit and cantilever probe holder with actuators have been implemented. The combined optimization and design work improved the capability of the original custom made high-speed AFM setup in both subsystem performance and jumping mode operation.","abstract_html":"In this thesis, I improved the design of a high-speed Atomic Force Microscope (AFM) for jumping mode operation. The relations between important imaging parameters and physical limitations of the system were established first to identify the aspects of improvement. Two control algorithms to improve the imaging speed and probe sample interaction force for jumping mode atomic force microscopy operation have been proposed and investigated both in simulation and experiment. A new generation of multi-actuated sample scanner has been designed to address the dynamic coupling, thermal expansion and range issues in the previous design. Improvements to the optical beam deflection system, photodiode circuit, signal conditioning circuit and cantilever probe holder with actuators have been implemented. The combined optimization and design work improved the capability of the original custom made high-speed AFM setup in both subsystem performance and jumping mode operation.","abstract_has_math":false,"creators":["Xia, Fangzhou"],"institution":"Massachusetts Institute of Technology","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":"Massachusetts Institute of Technology. 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The relations between important imaging parameters and physical limitations of the system were established first to identify the aspects of improvement. Two control algorithms to improve the imaging speed and probe sample interaction force for jumping mode atomic force microscopy operation have been proposed and investigated both in simulation and experiment. A new generation of multi-actuated sample scanner has been designed to address the dynamic coupling, thermal expansion and range issues in the previous design. Improvements to the optical beam deflection system, photodiode circuit, signal conditioning circuit and cantilever probe holder with actuators have been implemented. The combined optimization and design work improved the capability of the original custom made high-speed AFM setup in both subsystem performance and jumping mode operation."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["S.M."]},{"key":"dc:title","label":"Title","values":["Design and control optimization for high-speed jumping mode Atomic Force Microscope"]}]}],"canonical_facts":{"dc:contributor.advisor":["Kamal Youcef-Toumi."],"dc:contributor.department":["Massachusetts Institute of Technology. Department of Mechanical Engineering."],"dc:contributor.other":["Massachusetts Institute of Technology. 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A new generation of multi-actuated sample scanner has been designed to address the dynamic coupling, thermal expansion and range issues in the previous design. Improvements to the optical beam deflection system, photodiode circuit, signal conditioning circuit and cantilever probe holder with actuators have been implemented. The combined optimization and design work improved the capability of the original custom made high-speed AFM setup in both subsystem performance and jumping mode operation."],"dc:description.degree":["S.M."],"dc:identifier.uri":["http://hdl.handle.net/1721.1/111897"],"dc:language.iso":["eng"],"dc:publisher":["Massachusetts Institute of Technology"],"dc:rights":["MIT theses are protected by copyright. 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