Surface Potential Measurements of Micropatterned Self-Assembled Monolayers (SAMs) on n-Si (111) via Kelvin Probe Force Microscopy

GARCIA, MARIA CARMELA TAN

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Kyoto University

Surface Potential Measurements of Micropatterned Self-Assembled Monolayers (SAMs) on n-Si (111) via Kelvin Probe Force Microscopy

dc:creator GARCIA, MARIA CARMELA TAN

dc:date.issued2022

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Grantor dc:publisher: Kyoto University
Year dc:date.issued: 2022

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Author dc:creator: GARCIA, MARIA CARMELA TAN

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Statement dc:rights: 許諾条件により本文は2022-09-01に公開
Language dc:language.iso: eng

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Handle dc:identifier.uri: http://hdl.handle.net/2433/275219
OAI identifier oai:identifier: oai:repository.kulib.kyoto-u.ac.jp:2433/275219

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Harvested from: Kyoto University
Base URL: repository.kulib.kyoto-u.ac.jp/server/oai/request
Last updated: 2026-07-24
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GARCIA, MARIA CARMELA TAN. Surface Potential Measurements of Micropatterned Self-Assembled Monolayers (SAMs) on n-Si (111) via Kelvin Probe Force Microscopy. Kyoto University, 2022. http://hdl.handle.net/2433/275219

Surface Potential Measurements of Micropatterned Self-Assembled Monolayers (SAMs) on n-Si (111) via Kelvin Probe Force Microscopy

Degree

Author and committee

Subjects

Rights

Identifiers

Chain of custody

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