Surface Potential Measurements of Micropatterned Self-Assembled Monolayers (SAMs) on n-Si (111) via Kelvin Probe Force Microscopy
type: CreativeWork
author: GARCIA, MARIA CARMELA TAN
language: eng
keywords: self-assembled monolayers, surface potential, Kelvin Probe Force Microscope, surface dipole, VUV photolithography, Micropattern
date published: 2022-03-23
date modified: 2026-07-24T02:47:55Z
provider: Kyoto University
publisher: Networked Digital Library of Theses and Dissertations
type: WebPage
source organization: Kyoto University

PropertyValue
property ID: Handle
value: http://hdl.handle.net/2433/275219