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Iowa State University
A comparison of methods of measuring the thicknesses of thin metal films
Degree
thesis:*- Name thesis:degree_name
- Doctor of Philosophy
- Level thesis:degree_level
- dissertation
- Department dc:contributor.department
- Department of Physics and Astronomy
- Year dc:date.issued
- 1950
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Bearinger, Van
Rights
- Language dc:language.iso
- en
Identifiers
dc:identifier.*- Identifier
- archive/lib.dr.iastate.edu/rtd/12933/
- OAI identifier oai:identifier
- oai:dr.lib.iastate.edu:20.500.12876/66356