{"id":{"repo_id":"iastate","oai_identifier":"oai:dr.lib.iastate.edu:20.500.12876/66356"},"canonical_url":"https://search.dev.ndltd.org/etd/iastate/oai:dr.lib.iastate.edu:20.500.12876/66356","repository":{"repo_id":"iastate","name":"Iowa State University","base_url":"https://dr.lib.iastate.edu/server/oai/request"},"display":{"title":"A comparison of methods of measuring the thicknesses of thin metal films","abstract":"","abstract_html":null,"abstract_has_math":false,"creators":["Bearinger, Van"],"institution":null,"degree_name":"Doctor of Philosophy","degree_level":"dissertation","degree_discipline":null,"degree_department":"Department of Physics and Astronomy","school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":1950,"date_issued":"1950","date_published":"1950","updated_at":"2026-07-24T02:39:41Z","subjects":[],"languages":["en"],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier.doi","label":"DOI","values":["https://doi.org/10.31274/rtd-180813-14198"],"render_values":[{"text":"https://doi.org/10.31274/rtd-180813-14198","href":"https://doi.org/10.31274/rtd-180813-14198","code":true}]},{"key":"dc:identifier","label":"Identifier","values":["archive/lib.dr.iastate.edu/rtd/12933/"],"render_values":[{"text":"archive/lib.dr.iastate.edu/rtd/12933/","href":null,"code":true}]}]},"links":{"outbound_url":"https://dr.lib.iastate.edu/handle/20.500.12876/66356","outbound_label":"Repository record","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.department","label":"Department","values":["Department of Physics and Astronomy"]},{"key":"dc:creator","label":"Author","values":["Bearinger, Van"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2018-08-23T15:53:22.000"]},{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2020-06-30T07:24:53Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2020-06-30T07:24:53Z"]},{"key":"dc:date.issued","label":"Date","values":["1950"]},{"key":"dc:type","label":"Dc Type","values":["dissertation"]},{"key":"thesis:degree_level","label":"Degree Level","values":["dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Doctor of Philosophy"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["en"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["archive/lib.dr.iastate.edu/rtd/12933/"]},{"key":"dc:identifier.doi","label":"DOI","values":["https://doi.org/10.31274/rtd-180813-14198"]},{"key":"dc:identifier.uri","label":"Identifier URI","values":["https://dr.lib.iastate.edu/handle/20.500.12876/66356"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:format.mimetype","label":"Dc Format Mimetype","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["A comparison of methods of measuring the thicknesses of thin metal films"]}]}],"canonical_facts":{"dc:contributor.department":["Department of Physics and Astronomy"],"dc:creator":["Bearinger, Van"],"dc:date":["2018-08-23T15:53:22.000"],"dc:date.accessioned":["2020-06-30T07:24:53Z"],"dc:date.available":["2020-06-30T07:24:53Z"],"dc:date.issued":["1950"],"dc:format.mimetype":["application/pdf"],"dc:identifier":["archive/lib.dr.iastate.edu/rtd/12933/"],"dc:identifier.doi":["https://doi.org/10.31274/rtd-180813-14198"],"dc:identifier.uri":["https://dr.lib.iastate.edu/handle/20.500.12876/66356"],"dc:language.iso":["en"],"dc:title":["A comparison of methods of measuring the thicknesses of thin metal films"],"dc:type":["dissertation"],"thesis:degree_level":["dissertation"],"thesis:degree_name":["Doctor of Philosophy"]},"updated_at":"2026-07-24T02:39:41Z"}