Advanced methods in Spatially Modulated Illumination (SMI) microscopy

In this dissertation a new virtual microscopy appoach is presented in order to investigate the potentiality of spatially modulated illumination microscopy in topology investigation and nanosizing. Exerimental measuremnts will follow to all the theoretical previsions. Virtual microscopy evaluations and experiment measurements indicate that with spatially modulated illumination microscopy axial distance measurements in the one naonmeter range are feasible and, for the first time in farl field light micrsoscopy subwavelength size measurements down to 30 nm can be performed.

Level thesis:degree_level

thesis.doctoral

Grantor dc:publisher

Universität Heidelberg

Year

2002

Author dc:creator

• Failla, Antonio Virgilio

Contributors dc:contributor

• C. Cremer, Prof

Repository record source_url

http://www.ub.uni-heidelberg.de/archiv/2950

OAI identifier oai:identifier

oai:archiv.ub.uni-heidelberg.de:2950