{"id":{"repo_id":"heid-diss","oai_identifier":"oai:archiv.ub.uni-heidelberg.de:2950"},"canonical_url":"https://search.dev.ndltd.org/etd/heid-diss/oai:archiv.ub.uni-heidelberg.de:2950","repository":{"repo_id":"heid-diss","name":"Universität Heidelberg","base_url":"http://archiv.ub.uni-heidelberg.de/volltextserver/cgi/oai2"},"display":{"title":"Advanced methods in Spatially Modulated Illumination (SMI) microscopy","abstract":"In this dissertation a new virtual microscopy appoach is presented in order to investigate the potentiality of spatially modulated illumination microscopy in topology investigation and nanosizing. Exerimental measuremnts will follow to all the theoretical previsions. Virtual microscopy evaluations and experiment measurements indicate that with spatially modulated illumination microscopy axial distance measurements in the one naonmeter range are feasible and, for the first time in farl field light micrsoscopy subwavelength size measurements down to 30 nm can be performed.","abstract_html":"In this dissertation a new virtual microscopy appoach is presented in order to investigate the potentiality of spatially modulated illumination microscopy in topology investigation and nanosizing. Exerimental measuremnts will follow to all the theoretical previsions. Virtual microscopy evaluations and experiment measurements indicate that with spatially modulated illumination microscopy axial distance measurements in the one naonmeter range are feasible and, for the first time in farl field light micrsoscopy subwavelength size measurements down to 30 nm can be performed.","abstract_has_math":false,"creators":["Failla, Antonio Virgilio"],"institution":"Universität Heidelberg","degree_name":null,"degree_level":"thesis.doctoral","degree_discipline":null,"degree_department":null,"school":null,"contributors":["C. Cremer, Prof"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2002,"date_issued":"2002-07-03","date_published":"2002-07-03","updated_at":"2026-07-24T02:29:18Z","subjects":[],"languages":[],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://www.ub.uni-heidelberg.de/archiv/2950","outbound_label":"Repository record","outbound_source":"source_url"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["C. Cremer, Prof"]},{"key":"dc:creator","label":"Author","values":["Failla, Antonio Virgilio"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:publisher","label":"Institution","values":["Universitätsbibliothek Heidelberg"]},{"key":"dc:type","label":"Dc Type","values":["doctoralThesis"]},{"key":"thesis:degree_level","label":"Degree Level","values":["thesis.doctoral"]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Universität Heidelberg"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["In this dissertation a new virtual microscopy appoach is presented in order to investigate the potentiality of spatially modulated illumination microscopy in topology investigation and nanosizing. Exerimental measuremnts will follow to all the theoretical previsions. Virtual microscopy evaluations and experiment measurements indicate that with spatially modulated illumination microscopy axial distance measurements in the one naonmeter range are feasible and, for the first time in farl field light micrsoscopy subwavelength size measurements down to 30 nm can be performed."]},{"key":"dc:format.medium","label":"Dc Format Medium","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Advanced methods in Spatially Modulated Illumination (SMI) microscopy"]}]}],"canonical_facts":{"dc:contributor":["C. Cremer, Prof"],"dc:creator":["Failla, Antonio Virgilio"],"dc:description.abstract":["In this dissertation a new virtual microscopy appoach is presented in order to investigate the potentiality of spatially modulated illumination microscopy in topology investigation and nanosizing. Exerimental measuremnts will follow to all the theoretical previsions. Virtual microscopy evaluations and experiment measurements indicate that with spatially modulated illumination microscopy axial distance measurements in the one naonmeter range are feasible and, for the first time in farl field light micrsoscopy subwavelength size measurements down to 30 nm can be performed."],"dc:format.medium":["application/pdf"],"dc:publisher":["Universitätsbibliothek Heidelberg"],"dc:title":["Advanced methods in Spatially Modulated Illumination (SMI) microscopy"],"dc:type":["doctoralThesis"],"thesis:degree_level":["thesis.doctoral"],"thesis:institution_name":["Universität Heidelberg"]},"updated_at":"2026-07-24T02:29:18Z"}