Degree
thesis:*- Grantor dc:publisher
- ETH
- Year dc:date
- 2005
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Kottler, Christian
- Contributors dc:contributor
-
- Suter, Martin
- van der Veen, Friso Johannes
Subjects
dc:subject × 3- QUANTITATIVE X-RAY POWDER DIFFRACTOMETRY (CRYSTALLOGRAPHY); DURCHGANG VON IONEN DURCH MATERIE (ELEKTRODYNAMIK); EIGENSCHAFTEN DÜNNER SCHICHTEN (PHYSIK VON MOLEKULARSYSTEMEN); QUANTITATIVE RÖNTGENDIFFRAKTOMETRIE (KRISTALLOGRAPHIE); PROPERTIES OF THIN LAYERS (PHYSICS OF MOLECULAR SYSTEMS); PASSAGE OF IONS THROUGH MATTER (ELECTRODYNAMICS)
- info:eu-repo/classification/ddc/530
- Physics
Rights
dc:rights- Statement dc:rights
-
- info:eu-repo/semantics/openAccess
- In Copyright - Non-Commercial Use Permitted
- Language dc:language
- de
Identifiers
dc:identifier.*- Identifier
- https://doi.org/10.3929/ethz-a-005023780
- OAI identifier oai:identifier
- oai:www.research-collection.ethz.ch:20.500.11850/82746