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ETH Zürich

Fundamental aspects of scanning field-emission microscopy and some similarities with critical phenomena

dc:creator Zanin, Danilo A.

dc:date2017

Degree

thesis:*

Grantor dc:publisher: ETH Zürich
Year dc:date: 2017

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Zanin, Danilo A.
Contributors dc:contributor: Pescia, Danilo; id_orcid0000-0001-7436-418X
Werner, W.
Vaterlaus, A.
Gürlü, O.

Subjects

dc:subject × 3

SCANNING MICROSCOPES + SCANNING MICROSCOPY; RASTERMIKROSKOPE + RASTERMIKROSKOPIE; CALIBRATION AND TESTING OF INSTRUMENTS (PHYSICS); FIELD-EMISSION ELECTRON MICROSCOPES + FIELD-EMISSION ELECTRON MICROSCOPY; DIGITALE BILDVERARBEITUNG; EICHUNG UND PRÜFUNG VON MESSGERÄTEN (PHYSIK); DIGITAL IMAGE PROCESSING; FELDEMISSIONSELEKTRONENMIKROSKOPE + FELDEMISSIONSELEKTRONENMIKROSKOPIE
info:eu-repo/classification/ddc/530
Physics

Rights

dc:rights

Statement dc:rights: info:eu-repo/semantics/openAccess

In Copyright - Non-Commercial Use Permitted
Licence: http://rightsstatements.org/page/InC-NC/1.0/
Language dc:language: en

Identifiers

dc:identifier.*

Identifier: https://doi.org/10.3929/ethz-a-010866476
OAI identifier oai:identifier: oai:www.research-collection.ethz.ch:20.500.11850/129543

Chain of custody

source

Harvested from: ETH Zürich
Base URL: www.research-collection.ethz.ch/oai/request
Last updated: 2026-07-27
Source record: OAI-PMH GetRecord

related terms

citation

Zanin, Danilo A.. Fundamental aspects of scanning field-emission microscopy and some similarities with critical phenomena. ETH Zürich, 2017. http://hdl.handle.net/20.500.11850/129543

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