Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy

The establishment of printing technologies, using nanoparticle based inks, promises inexpensive manufacture of electronic devices. However, to produce working devices, nanoparticles have to meet requirements on size, shape, and composition. In the application of silicon nanoparticles in electronics, it is important that a network of interconnecting particles is formed through which charge transport can take place. Of further importance is that there is an absence of surface oxide in order to maintain a direct silicon-silicon connection within the network. In this work, cheap and scalable production of silicon nanoparticles is achieved efficiently with a top-down process of mechanical attrition by high energy milling.

Grantor dc:publisher.institution

Department of Physics

Year dc:date.issued

2012

Author dc:creator

• Unuigbe, David Moweme

Advisors dc:contributor.advisor

• Britton, David T
• Härting, Margit

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/11427/12105

OAI identifier oai:identifier

oai:open.uct.ac.za:11427/12105