{"id":{"repo_id":"cape-town","oai_identifier":"oai:open.uct.ac.za:11427/12105"},"canonical_url":"https://search.dev.ndltd.org/etd/cape-town/oai:open.uct.ac.za:11427/12105","repository":{"repo_id":"cape-town","name":"University of Cape Town","base_url":"https://open.uct.ac.za/oai/request"},"display":{"title":"Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy","abstract":"The establishment of printing technologies, using nanoparticle based inks, promises inexpensive manufacture of electronic devices. However, to produce working devices, nanoparticles have to meet requirements on size, shape, and composition. In the application of silicon nanoparticles in electronics, it is important that a network of interconnecting particles is formed through which charge transport can take place. 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However, to produce working devices, nanoparticles have to meet requirements on size, shape, and composition. In the application of silicon nanoparticles in electronics, it is important that a network of interconnecting particles is formed through which charge transport can take place. Of further importance is that there is an absence of surface oxide in order to maintain a direct silicon-silicon connection within the network. 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