Composition analysis of high-Tc superconducting thin films by quantitative x-ray fluorescence

A method is presented for determining the composition of thin films containing the elements Bi, Sr, Br, Cu, and Ca. Quantitative x-ray fluorescence (XRF) consisting of radioactive sources (secondary foil excitor 241Am-Mo source and 55Pe source), a Si(Li) detector, and a multichannel analyzer were employed. The XRF system was calibrated by using sol gel thin films of known element composition and also by sputtered thin films analyzed by the conventional Rutherford Back Scattering (RBS). The XRF system has been used to assist and optimize the sputter target composition required to produce high-Tc BiSrCaCuO films with the desired metal composition.

Name thesis:degree_name

M.Sc. Physics

Level thesis:degree_level

Masters

Discipline thesis:degree_discipline

Faculty of Mathematics and Science

Department dc:contributor.department

Department of Physics

Grantor

Brock University

Year dc:date.issued

1992

Author dc:creator

• Elsahlli, Tareg.

• X-ray spectroscopy.
• Thin films--Analysis.
• High temperature superconductivity.
• Syperconductivity.

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/10464/1808

OAI identifier oai:identifier

oai:brocku.scholaris.ca:10464/1808