{"id":{"repo_id":"brock","oai_identifier":"oai:brocku.scholaris.ca:10464/1808"},"canonical_url":"https://search.dev.ndltd.org/etd/brock/oai:brocku.scholaris.ca:10464/1808","repository":{"repo_id":"brock","name":"Brock University","base_url":"https://brocku.scholaris.ca/server/oai/request"},"display":{"title":"Composition analysis of high-Tc superconducting thin films by quantitative x-ray fluorescence","abstract":"A method is presented for determining the composition of thin films containing the elements Bi, Sr, Br, Cu, and Ca. Quantitative x-ray fluorescence (XRF) consisting of radioactive sources (secondary foil excitor 241Am-Mo source and 55Pe source), a Si(Li) detector, and a multichannel analyzer were employed. The XRF system was calibrated by using sol gel thin films of known element composition and also by sputtered thin films analyzed by the conventional Rutherford Back Scattering (RBS). The XRF system has been used to assist and optimize the sputter target composition required to produce high-Tc BiSrCaCuO films with the desired metal composition.","abstract_html":"A method is presented for determining the composition of thin films containing the elements Bi, Sr, Br, Cu, and Ca. Quantitative x-ray fluorescence (XRF) consisting of radioactive sources (secondary foil excitor 241Am-Mo source and 55Pe source), a Si(Li) detector, and a multichannel analyzer were employed. The XRF system was calibrated by using sol gel thin films of known element composition and also by sputtered thin films analyzed by the conventional Rutherford Back Scattering (RBS). The XRF system has been used to assist and optimize the sputter target composition required to produce high-Tc BiSrCaCuO films with the desired metal composition.","abstract_has_math":false,"creators":["Elsahlli, Tareg."],"institution":"Brock University","degree_name":"M.Sc. Physics","degree_level":"Masters","degree_discipline":"Faculty of Mathematics and Science","degree_department":"Department of Physics","school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":1992,"date_issued":"1992-07-09T17:34:30Z","date_published":"1992-07-09T17:34:30Z","updated_at":"2026-07-24T01:23:05Z","subjects":["X-ray spectroscopy.","Thin films--Analysis.","High temperature superconductivity.","Syperconductivity."],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/10464/1808","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.department","label":"Department","values":["Department of Physics"]},{"key":"dc:creator","label":"Author","values":["Elsahlli, Tareg."]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2009-07-09T17:34:30Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2009-07-09T17:34:30Z"]},{"key":"dc:date.issued","label":"Date","values":["1992-07-09T17:34:30Z"]},{"key":"dc:type","label":"Dc Type","values":["Electronic Thesis or Dissertation"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Faculty of Mathematics and Science"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.Sc. Physics"]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Brock University"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["X-ray spectroscopy.","Thin films--Analysis.","High temperature superconductivity.","Syperconductivity."]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/10464/1808"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["A method is presented for determining the composition of thin films containing the elements Bi, Sr, Br, Cu, and Ca. Quantitative x-ray fluorescence (XRF) consisting of radioactive sources (secondary foil excitor 241Am-Mo source and 55Pe source), a Si(Li) detector, and a multichannel analyzer were employed. The XRF system was calibrated by using sol gel thin films of known element composition and also by sputtered thin films analyzed by the conventional Rutherford Back Scattering (RBS). The XRF system has been used to assist and optimize the sputter target composition required to produce high-Tc BiSrCaCuO films with the desired metal composition."]},{"key":"dc:title","label":"Title","values":["Composition analysis of high-Tc superconducting thin films by quantitative x-ray fluorescence"]}]}],"canonical_facts":{"dc:contributor.department":["Department of Physics"],"dc:creator":["Elsahlli, Tareg."],"dc:date.accessioned":["2009-07-09T17:34:30Z"],"dc:date.available":["2009-07-09T17:34:30Z"],"dc:date.issued":["1992-07-09T17:34:30Z"],"dc:description.abstract":["A method is presented for determining the composition of thin films containing the elements Bi, Sr, Br, Cu, and Ca. Quantitative x-ray fluorescence (XRF) consisting of radioactive sources (secondary foil excitor 241Am-Mo source and 55Pe source), a Si(Li) detector, and a multichannel analyzer were employed. The XRF system was calibrated by using sol gel thin films of known element composition and also by sputtered thin films analyzed by the conventional Rutherford Back Scattering (RBS). The XRF system has been used to assist and optimize the sputter target composition required to produce high-Tc BiSrCaCuO films with the desired metal composition."],"dc:identifier.uri":["http://hdl.handle.net/10464/1808"],"dc:language.iso":["eng"],"dc:subject":["X-ray spectroscopy.","Thin films--Analysis.","High temperature superconductivity.","Syperconductivity."],"dc:title":["Composition analysis of high-Tc superconducting thin films by quantitative x-ray fluorescence"],"dc:type":["Electronic Thesis or Dissertation"],"thesis:degree_discipline":["Faculty of Mathematics and Science"],"thesis:degree_level":["Masters"],"thesis:degree_name":["M.Sc. Physics"],"thesis:institution_name":["Brock University"]},"updated_at":"2026-07-24T01:23:05Z"}