Characterization and modeling of low-frequency noise in MOSFETs

For many years, RF and analog integrated circuits have been mainly developed using bipolar and compound semiconductor technologies due to their better performance. In the last years, the advance made in CMOS technology allowed analog and RF circuits to be built with such a technology, but the use of CMOS technology in RF application instead of bipolar technology has brought more issues in terms of noise. The noise cannot be completely eliminated and will therefore ultimately limit the accuracy of measurements and set a lower limit on how small signals can be detected and processed in an electronic circuit. One kind of noise which affects MOS transistors much more than bipolar ones is the low-frequency noise. In MOSFETs, low-frequency noise is mainly of two kinds: flicker or 1/f noise and random telegraph signal noise (RTS). The objective of this thesis is to characterize and to model the low-frequency noise by studying RTS and flicker noise under both constant and switched bias conditions. The effect of different biasing schemes on both RTS and flicker noise in time and frequency domain has been investigated.

Grantor dc:publisher

Alma Mater Studiorum - Università di Bologna

Year dc:date

2009

Author dc:creator

• Zanolla, Nicola <1980>

Contributors dc:contributor

• Fiegna, Claudio

• ING-INF/01 Elettronica

Statement dc:rights

• info:eu-repo/semantics/openAccess

Language dc:language

en

Identifier

urn:nbn:it:unibo-1205

OAI identifier oai:identifier

oai:amsdottorato.cib.unibo.it:1333