High Temperature CMOS Silicon Carbide Asynchronous Circuit Design

<p>Designing a digital circuit to operate in an extreme temperature range is a challenge with increasing demand for a solution. Large variations in temperature have a distinct impact on electron mobilities causing substantial changes to the threshold voltage of the devices. These physical changes affect the setup and hold times of clocked components, such as D-Flip Flops, of a traditional synchronous digital circuit. Focusing primarily on high temperature circuit operation, this dissertation presents a digital circuit design methodology pairing an asynchronous circuit design paradigm called NULL Convention Logic (NCL) as well as traditional Boolean circuitry with a wide-bandgap semiconductor material, Silicon Carbide (SiC). A total of nineteen circuits have been designed and fabricated. Chip testing results show correct operation for all circuits returned from fabrication, with most performing at or above the targeted temperature of 300°C.</p>

Name thesis:degree_name

Doctor of Philosophy in Engineering (PhD)

Level thesis:degree_level

Dissertation

Year dc:date.available

2015

Author dc:creator

• Caley, Landon John

Advisor dc:contributor.advisor

• Di, Jia

Contributors dc:contributor

• Mantooth, H. Alan

• Asynchronous
• Design flow
• Digital
• High temperature
• Integrated circuit
• Silicon carbide
• Electrical and Computer Engineering
• VLSI and Circuits, Embedded and Hardware Systems

Repository record dc:identifier

https://scholarworks.uark.edu/etd/30

OAI identifier oai:identifier

oai:scholarworks.uark.edu:etd-1029