Back to search

Fraunhofer IRB Verl.

Simulationsrechnungen zur FTIR-reflexionsspektroskopischen Charakterisierung von Schicht- und Fasersystemen

Abstract

dc:description

The Fourier-Transform-Infrared (FTIR) specular reflection spectroscopy has been applied to non-destructive characterization of layered systems, ceramic fibres and fibre composites. The required finding out of the optical functions of the sample materials as well as of the parameters of the sample topology fails by using conventional spectra interpretations. So only spectra simulations basing on optical models which adequately describe the samples allowed to extract relevant analytical information from measured reflection spectra about topology and composition of the samples. The characterization of layers was focused on ceramic layers – deposited by chemical vapour deposition (CVD) – as silicon carbide (SiC) deposited on graphite substrate and silicon carbooxynitride (SiCxNyOz) deposited on steel substrate. To simulate their corresponding FTIR-reflection spectra special gradient models basing on the effective medium approximation as well as oscillator models had to be developed. The investigation of ceramic fibres and fibre composites required the theoretical extension of the optical standard models. So by taking the curvature of the fibre surface into account in the optical model all features of the FTIR-reflection spectra (using a FTIR-microscope) of SiC-single fibres could be described correctly. Furthermore the alignment of carbon fibres embedded in a polymer matrix has been considered by generalizing of the standard optical model to included anisotrotropic media.

Degree

thesis:*
Grantor dc:publisher
Fraunhofer IRB Verl.
Year dc:date
2002

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Grählert, Wulf
Contributors dc:contributor
  • Hopfe, Volkmar

Subjects

dc:subject × 2

Rights

dc:rights
Statement dc:rights
  • info:eu-repo/semantics/openAccess
Language dc:language
ger

Identifiers

dc:identifier.*

Chain of custody

source
Harvested from
RWTH Aachen University
Base URL
publications.rwth-aachen.de/oai2d
Last updated
2026-07-30
Source record
OAI-PMH GetRecord
citation

Grählert, Wulf. Simulationsrechnungen zur FTIR-reflexionsspektroskopischen Charakterisierung von Schicht- und Fasersystemen. Fraunhofer IRB Verl., 2002. https://publications.rwth-aachen.de/record/52143