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Showing 1 to 20 of 668 for “"xps"”.
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Chalkogeninių kristalų elektroninės sandaros ir XPS juostų formų tyrimas /
Metal, semiconductor crystals and their alloy XPS are measuring in the world. However, the ferroelectric electronic structure, form bands and their changes were not investigated. The aim of dissertation is to interpret and theoretically calculate the experimentally measured SbSI, SbSeI, BiSI, …
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Untersuchungen zu Schichtwachstum und Grenzflächen an Ta-basierten Dünnschichten mittels XPS
… Photoelektronenspektroskopie (ARXPS). Die Analysen erfolgen in situ, ohne Unterbrechung des Ultrahochvakuums, um die Deposite vor Oxidation und Kontamination zu schützen. Zur zerstörungsfreien Tiefenprofilanalyse wird ein Quantifizierungsalgoritmus beschrieben und angewandt. Für …
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XPS and Carbon-13 NMR spectroscopic analysis of composite rocket propellants
… study the applicability of Carbon-13 NMR and XPS to the detection of chemical changes in a solid composite rocket propellant was studied. Storage at elevated temperatures was used to simulate the propellant ageing process. In the XPS analysis, changes in the sources for the N(1s) and Cl(2p) …
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Stability of dental alloys in artificial saliva: an electrochemical and XPS investigation
… 1.4456 has been studied with electrochemical and XPS surface analytical techniques at 25°C and at 37°C. Surface analysis has shown that the alloy in artificial saliva forms a protective passive film at both temperatures. At 25°C the oxy-hydroxide film formed is enriched in oxidized chromium, after …
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Ion bombardment induced compositional changes in compound semiconductor surfaces studied by XPS combined with LEISS
… by combining X-ray Photoelectron Spectroscopy (XPS) and Low Energy Ion Scattering Spectroscopy (LEISS). The purpose of using this complementary analytical method is to obtain more complete experimental evidence of ion beam modification in surfaces of compound semiconductors and GeSi alloy to …
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Characterizing the chemistry of yellow-poplar surfaces exposed to different surface energy environments using DCA, DSC, and XPS
… (DCA) and X-ray photoelectron spectroscopy (XPS) analysis. Results show that the surface molecular orientation of yellow-poplar can be controlled by increasing the temperature above the Tg of lignin with exposure to either an environment of higher (aluminum) or lower (teflon) surface energy. …
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Metal deposition on TiO2(110) via thermal evaporation, photolysis and thermolysis: a combined FT-RAIRS and XPS study
… (110), (100) and (111) facets. By comparing XPS and FT-RAIRS results collected before and after annealing, a complex growth mode is proposed which resembles a combination of Volmer-Weber and Stranski-Krastanov types. The reactivity between O2 and pre-adsorbed CO appeared highest for the …
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Investigation of growth kinetics of self-assembling monolayers by means of contact angle, optical ellipsometry, angle-resolved XPS and IR spectroscopy.
… angle, optical ellipsometry, angle-resolved XPS (ARXPS), and with grazing angle total reflection FTIR. Growth of the monolayers from dilute solutions has been monitored and Langmuir isotherm adsorption curves were fitted to experimental data. A saturated film is formed within approximately 5h …
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The electronic structure of galena and hematite surfaces: applications to the interpretations of STM images, XPS spectra and heterogeneous surface reactions
… to terraces. X-ray photoelectron spectra (XPS) were calculated to compare the photoelectron peaks of the calculated specific surface structures (that do not have a bulk equivalent) with experimentally obtained XPS spectra. Most of the calculated peak chemical shifts coincided with those …
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AUGER ELECTRON SPECTROSCOPY OF CRYOGENIC MATRIX ISOLATED METAL ATOMS AND DIRECT RECOIL SPECTROSCOPY (DRS), SIMS AND XPS STUDIES ON TITANIUM AND PIQ
… (DRS), X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectroscopy (SIMS) to determine the effects of argon and nitrogen ion implantation, oxygen recoil implantation, and vacuum annealing. A hydrocarbon contaminant that cannot be detected by XPS alone was confirmed to exist …
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X-ray photoelectron spectroscopy (XPS) study of single crystal UO2 and U3O8 on r-plane sapphire and yttrium stabilized zirconium (YSZ) substrates
… films using X-ray Photoelectron Spectroscopy (XPS), X-ray Diffraction (XRD), Rutherford Backscattering Spectroscopy (RBS), and Secondary Ion Mass Spectroscopy (SIMS). This thesis will primarily focus on the growth of the thin films, and the analyzed results from X-ray Photoelectron Spectroscopy …
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Concentration depth-profile reconstruction from angle-resolved XPS data using the maximum entropy method: characterization of surface film formed on Ni-18P alloy
… depth-profile should be consistent with the ARXPS data. However, transformation of XPS intensities vs. emission angle into concentrations vs. depth data is an ill posed mathematical problem. The main goal of this work was thus to develop a new, iterative algorithm based on the maximum entropy …
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N-heterocyclic Carbene Synthesis Towards Self-Assembled Monolayers on Gold
… analyzed using x-ray photoelectron spectroscopy (XPS). N,N’-Ditolyl-4,5(R,R)-diphenylimidazolium tetrafluroborate (19) is a known molecule with chiral functionality about the backbone and successfully formed a SAM on gold with a calculated carbon to nitrogen ratio of 29:2 from XPS analysis …
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EXPLORATION OF TM-NX ORR ELECTROCATALYSTS FROM FIRST PRINCIPLE CALCULATIONS
… interdependent. Additional focus will also be on XPS characterization for the identification of the nature of proposed catalytic site(s). Although XPS is a widely used experimental technique for this purpose, the unique identification of structural motifs from XPS observations alone remains …
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Abscheidung und Zersetzung von Selten-Erd-Oxid-Precursorn auf der H-terminierten Si(111)- und der SiO 2 -Oberfläche
… der Röntgenphotoelektronenspektroskopie (XPS), der Rastertunnel- und der Rasterkraftmikroskopie sowie der Transmissionselektronenmikroskopie untersucht. Über XPS wurden Hinweise auf die Bildung einer Zwischenschicht zwischen dem Substrat und dem La2O3 gefunden. Über winkelabhängige …
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Carbon fiber surface treatments for improved adhesion to thermoplastic polymers
… examined by x-ray photoelectron spectroscopy (XPS). The surfaces of carbon fibers after anodization in NaOH and H₂SO₄ were examined by scanning transmission electron microscopy (STEM). angular dependent XPS, ultraviolet (UV) absorption spectroscopy of the anodization bath, secondary ion mass …
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The adsorption of sulfur and halogen containing materials on nickel studied by X-ray photoelectron spectroscopy and thermal desorption spectroscopy
… using an X-ray photoelectron spectrometer (XPS) and a thermal desorption system with mass spectrometric analysis (TD). The ion implantation of the methyl halide series on nickel was investigated by XPS. The nickel surface was cleaned by high temperature heating in vacuum or argon ion …
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Characterization of thin silicone films formed by migration across defined polymer substrates
… techniques of x-ray photoelectron spectroscopy (XPS), reflection absorption spectroscopy (RAS), and contact angle analysis were used to investigate this problem. XPS analysis indicated that the surface spreading or "creeping" was very slow, moving only several centimeters per several hundred …
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