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Showing 1 to 10 of 10 for “"semiconductor test"”.

  1. Modular semiconductor test, assembly & packaging manufacturing equipment design

    Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1998.

    mit Repository record for Modular semiconductor test, assembly & packaging manufacturing equipment design (opens in a new tab)

  2. Design and prototype fabrication of a manipulator for semiconductor test equipment

    Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1996.

    mit Repository record for Design and prototype fabrication of a manipulator for semiconductor test equipment (opens in a new tab)

  3. Product strategy in response to technological innovation in the semiconductor test industry

    After the market boom of 2000 in the semiconductor industry changed significantly. The changes included stricter limits on capital cost spending, and the increased propensity of the industry to outsource the manufacturing of semiconductors. Thus, the semiconductor industry demanded greater cost of …

    mit Repository record for Product strategy in response to technological innovation in the semiconductor test industry (opens in a new tab)

  4. A data-driven approach to improving capacity utilization of semiconductor test equipment

    Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996.

    mit Repository record for A data-driven approach to improving capacity utilization of semiconductor test equipment (opens in a new tab)

  5. The engineering case study as a basis for the Master of Science thesis : the Teradyne, Inc. case study : a kinematic interface for semiconductor test equipment

    … Case Study completed at Teradyne, Inc., a semiconductor test equipment manufacturer. Advantages of the proposed Master's program to the student and to industry are discussed, as are potential uses of the resultant Engineering Case Study in the classroom and in industry.

    mit Repository record for The engineering case study as a basis for the Master of Science thesis : the Teradyne, Inc. case study : a kinematic interface for semiconductor test equipment (opens in a new tab)

  6. Supply chain & organizational behavior through the three lenses : a case study

    … entry (IC programming socket market) by the semiconductor bum-in socket business unit of ACME Inc. The new market entry is done such that the solutions currently provided in the bum-in market are made to operate in a larger solution space with minimal changes to the product/solution to help …

    mit Repository record for Supply chain & organizational behavior through the three lenses : a case study (opens in a new tab)

  7. Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies

    Methods for Extending High-Performance Automated Test Equipment (ATE) using Multi-Gigahertz FPGA Technologies Ashraf M. Majid 264 Pages Directed by Dr. David Keezer This thesis presents methods for developing multi-function, multi-GHz, FPGAbased test modules designed to enhance the performance …

    gatech Repository record for Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies (opens in a new tab)

  8. Contact-type mechanical interfaces for high speed digital interconnects

    … are being developed, especially in the field of semiconductor test. These contactors will be incorporated into a socket or an interconnect used in testing devices or printed circuit boards. The heights of the solder ball leads on BGA packages have a high degree of co-planarity. As BGA pitches …

    mit Repository record for Contact-type mechanical interfaces for high speed digital interconnects (opens in a new tab)

  9. Scheduling of Wafer Test Processes in Semiconductor Manufacturing

    … systems. This research focuses on solving the test scheduling problem which arises in semiconductor manufacturing environment. Semiconductor wafer devices undergo a series of test processes conducted on computer-controlled test stations at various temperatures. A test process consists of both …

    vt Repository record for Scheduling of Wafer Test Processes in Semiconductor Manufacturing (opens in a new tab)