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Showing 1 to 20 of 47 for “"profilometer"”.

  1. Design and implementation of a high precision profilometer

    … microscopy (AFM). The major components of the profilometer were: 1) a commercial atomic force microscope, 2) customized sample positioning hardware, 3) image processing and control software, and 4) system calibration procedures. The primary focus of this thesis is on the design and …

    mit Repository record for Design and implementation of a high precision profilometer (opens in a new tab)

  2. Design and simulation of a rapid high percision profilometer

    … hardware design and simulation of the customized profilometer. The design enables the system to simultaneously scan both surfaces of the sample, which increases speed, as well as compensate for distorted samples. The image reconstruction algorithms and system homogeneous transformation matrices …

    mit Repository record for Design and simulation of a rapid high percision profilometer (opens in a new tab)

  3. Sensor Fused Scene Reconstruction and Surface Inspection

    … defects can be measured with an actuated optical profilometer. The depth sensor uses a modified Kinect Fusion to create a contextual map of the environment. A custom actuated optical profilometer is created and then calibrated. The two systems are then registered to each other to place local …

    vt Repository record for Sensor Fused Scene Reconstruction and Surface Inspection (opens in a new tab)

  4. Error Mitigation in Roughness Measurements

    … Terrain Performance Lab's (VTPL) Ford Explorer profilometer. Next, INS errors were addressed. These may include drift in the inertial measurement unit or errors due to poor reception with the global navigation satellite system. The solution to these errors was demonstrated through the VTPL's …

    vt Repository record for Error Mitigation in Roughness Measurements (opens in a new tab)

  5. Microwave Overlay Capacitor Fabrication on Printed Circuit Boards

    … 𝜇𝑚. Surface profile sweeps were taken with a profilometer as high texture made the profilometer unsuitable for thickness measurements. The capacitor area was measured with a calibrated optical microscope. Low frequency measurements were conducted with a Solartron 1170 Frequency Response …

    queens Repository record for Microwave Overlay Capacitor Fabrication on Printed Circuit Boards (opens in a new tab)

  6. Data processing in nanoscale profilometry

    … probe microscope. A prototype of a nanoscale profilometer based on the scanning probe microscope has been built in the Laboratory for Manufacturing and Productivity at MIT. A sample is placed on a precision flip stage and different sides of the sample are scanned under the SPM to acquire its …

    mit Repository record for Data processing in nanoscale profilometry (opens in a new tab)

  7. Design, Fabrication, and Characterization of an Electrostatically Actuated Microfluidic Valve

    … of PDMS surfaces without risk of damaging the profilometer tip, a development that could allow for much more control over PDMS film thicknesses in future projects.

    calpoly Repository record for Design, Fabrication, and Characterization of an Electrostatically Actuated Microfluidic Valve (opens in a new tab)

  8. Investigation of the Interactions Between Sanitizers, Surface Characteristics, Washing Conditions, and Bacteria for Improving Microbial Safety of Fresh Produce

    … good agreement with that measured with a surface profilometer. The surface roughness played an important role in the removal and inactivation of E. coli O157:H7 inoculated onto fresh fruits during sanitizing treatments. Washing condition tests showed that the residual bacterial population …

    uiuc Repository record for Investigation of the Interactions Between Sanitizers, Surface Characteristics, Washing Conditions, and Bacteria for Improving Microbial Safety of Fresh Produce (opens in a new tab)

  9. An Investigation of Wear-Resistant Coatings on an A390 Die-Cast Aluminum Substrate

    … lost, through wear, was measured using a profilometer, and finally a scanning electron microscope which was used to identify the dominate mechanism of wear in the sheave material. All of the tests showed the hard chrome coating to have the lowest wear rates and the best wear …

    byu Repository record for An Investigation of Wear-Resistant Coatings on an A390 Die-Cast Aluminum Substrate (opens in a new tab)

  10. Data acquisition systems for three-dimensional representation and analysis of surface topography and surface temperatures in tribological processes

    … parallel traverses of the stylus of a Talysurf 4 profilometer. MOVIE.BYU and Tektronix graphics terminals were used to display the models of the surfaces. Surface temperatures generated by friction were measured using a Barnes RM-2A Infrared Radiometric Microscope. The sliding system consisted of …

    vt Repository record for Data acquisition systems for three-dimensional representation and analysis of surface topography and surface temperatures in tribological processes (opens in a new tab)

  11. Modelling, inspection, and post-processing of layer-based additive manufacturing surfaces to maintain product quality

    … when a good agreement with the corresponding 2D profilometer inspection is observed. Acetone vapour bath smoothing is used for post-processing of FDM parts. The number of smoothing cycles, and the duration of each cycle are considered as the main smoothing parameters. Effect of geometric …

    uoit Repository record for Modelling, inspection, and post-processing of layer-based additive manufacturing surfaces to maintain product quality (opens in a new tab)

  12. Machining induced defects in Relaxor ferroelectric PMN-PT crystals

    … surfaces are examined by non-contact optical profilometer for planarity and roughness, scanning electron microscopy for subsurface damage, and by micro-raman spectroscopic analysis and X-ray diffraction analysis to uncover machining induced phase transformations. The analysis reveals the …

    iastate Repository record for Machining induced defects in Relaxor ferroelectric PMN-PT crystals (opens in a new tab)

  13. Magnetic Properties Of Sputter Deposited Fe-based Amorphous Thin Films For Resonator Application

    … of the films was determined by use of a stylus profilometer. The M-H Looper studies indicated that the induced anisotropy (Hk) depends strongly on the nickel concentration as well as on the annealing conditions, specifically the time and temperature of the annealing process. For the same …

    ucf

  14. Development of an ion transport system for singly charged ion injection into an electron string ion source (ESIS) charge-breeder

    … with the ESIS. A multi-wire harp beam profilometer was used to study ion beam profiles and to obtain geometric parameters of Ga+ beams. Ga+ injection into the KRION 6T ESIS was performed successfully using the ion injection system. The extraction of multiply charged gallium was …

    cape-town Repository record for Development of an ion transport system for singly charged ion injection into an electron string ion source (ESIS) charge-breeder (opens in a new tab)

  15. Double-sided microchannel patterning and through-hole production using injection molding of polypropylene

    … diameter measurements obtained with an optical profilometer. The results were compared to a research study previously conducted on hot embossed and through-hole punched parts. The walls of the injection molded microchannels were observed to be smoother than the hot embossed microchannels, but …

    mit Repository record for Double-sided microchannel patterning and through-hole production using injection molding of polypropylene (opens in a new tab)

  16. Fabrication and material characterization of silver cantilevers via direct surface micromachining

    … measurements made by a P-10 contact profilometer or a Hysitron nanoindentor. We present findings of 21.9±1.50GPa or 22±1.5GPa for the silver ink's Young's modulus of elasticity, depending on the characterization method. These measurements were consistent with results measured by …

    mit Repository record for Fabrication and material characterization of silver cantilevers via direct surface micromachining (opens in a new tab)

  17. Análise da rugosidade superficial de uma resina nanoparticulada e de um ionômero de vidro resinoso após ação de aparelho profilático

    … - 10s). Data were collected with the aid of the profilometer (Mitutoyo SJ - P 201, Japan) through three readings in the specimen (one in the center and two on each side) and analyzed taking into consideration the average roughness (Ra) in microns (μm), using the paired t test, ANOVA and Tukey's …

    brazil-ufpb Repository record for Análise da rugosidade superficial de uma resina nanoparticulada e de um ionômero de vidro resinoso após ação de aparelho profilático (opens in a new tab)

  18. An Investigation of Nailed Connection Performance in a Cyclic Humidity Environment

    … between wood-based members. An x-ray density profilometer was used to observe the de-densification processes within the composite sheathing materials throughout the moisture conditioning regime. Results indicated moderate to extreme changes in the performance of cycled connections involving …

    vt Repository record for An Investigation of Nailed Connection Performance in a Cyclic Humidity Environment (opens in a new tab)

  19. Characterization of Filter Cake Buildup and Cleanup under Dynamic Fluid Loss Conditions

    … filter cake was measured with a precise laser profilometer. Correlations are proposed to estimate filter cake properties (thickness, concentration and yield stress) based on pumping conditions (pump rate, time and net pressure) and rock properties. With these properties known, a required flow …

    tdl Repository record for Characterization of Filter Cake Buildup and Cleanup under Dynamic Fluid Loss Conditions (opens in a new tab)

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